Howells, S., Chen, T., & Gallagher, M. (1991). Enhanced effects with scanning force microscopy. Journal of Applied Physics, 69, 7330. https://doi.org/10.1063/1.347586
Chicago Style (17th ed.) CitationHowells, S., T. Chen, and M. Gallagher. "Enhanced Effects with Scanning Force Microscopy." Journal of Applied Physics 69 (1991): 7330. https://doi.org/10.1063/1.347586.
MLA (9th ed.) CitationHowells, S., et al. "Enhanced Effects with Scanning Force Microscopy." Journal of Applied Physics, vol. 69, 1991, p. 7330, https://doi.org/10.1063/1.347586.
Warning: These citations may not always be 100% accurate.
