Enhanced effects with scanning force microscopy.
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| Title: | Enhanced effects with scanning force microscopy. |
|---|---|
| Authors: | Howells, S., Chen, T., Gallagher, M. |
| Source: | Journal of Applied Physics; May 15 1991, Vol. 69, p7330-7332, 3p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 501877604 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Enhanced effects with scanning force microscopy. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Howells%2C+S%2E%22">Howells, S.</searchLink><br /><searchLink fieldCode="AU" term="%22Chen%2C+T%2E%22">Chen, T.</searchLink><br /><searchLink fieldCode="AU" term="%22Gallagher%2C+M%2E%22">Gallagher, M.</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; May 15 1991, Vol. 69, p7330-7332, 3p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501877604 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1063/1.347586 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 3 StartPage: 7330 Titles: – TitleFull: Enhanced effects with scanning force microscopy. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Howells, S. – PersonEntity: Name: NameFull: Chen, T. – PersonEntity: Name: NameFull: Gallagher, M. IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 05 Text: May 15 1991 Type: published Y: 1991 Identifiers: – Type: issn-print Value: 00218979 Numbering: – Type: volume Value: 69 Titles: – TitleFull: Journal of Applied Physics Type: main |
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