Deep-level transient spectroscopy characterization of silicon-silicon interfaces.
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| Title: | Deep-level transient spectroscopy characterization of silicon-silicon interfaces. |
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| Authors: | Stievenard, D., Wallart, X., Mathiot, D. |
| Source: | Journal of Applied Physics; June 1 1991, Vol. 69, p7640-7644, 5p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.347534 |
