Oblique grain boundaries: analysis of light and electron beam induced current profiles in silicon.
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| Title: | Oblique grain boundaries: analysis of light and electron beam induced current profiles in silicon. |
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| Authors: | Mittiga, A., Capizzi, M., Coluzza, C. |
| Source: | Journal of Applied Physics; May 1 1988, Vol. 63, p4748-4750, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.340135 |
