The influence of ion beam mixed TiSi2 layers on reverse characteristics of diodes.
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| Title: | The influence of ion beam mixed TiSi2 layers on reverse characteristics of diodes. |
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| Authors: | Dehm, C., Burte, E. P., Gyulai, J. |
| Source: | Journal of Applied Physics; May 1 1992, Vol. 71, p4365-4369, 5p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.350796 |
