In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu2ZnSnS4 layers for solar cell applications.
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| Title: | In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu2ZnSnS4 layers for solar cell applications. |
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| Authors: | Fontané, X., Calvo-Barrio, L., Izquierdo-Roca, V. |
| Source: | Applied Physics Letters; May 2 2011, Vol. 98 Issue 18, p181905-1-181905-3, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
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| DOI: | 10.1063/1.3587614 |
