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In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu2ZnSnS4 layers for solar cell applications.

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Title: In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu2ZnSnS4 layers for solar cell applications.
Authors: Fontané, X., Calvo-Barrio, L., Izquierdo-Roca, V.
Source: Applied Physics Letters; May 2 2011, Vol. 98 Issue 18, p181905-1-181905-3, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 502035040
AccessLevel: 2
PubType: Academic Journal
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  Data: In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu2ZnSnS4 layers for solar cell applications.
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  Data: <searchLink fieldCode="AU" term="%22Fontané%2C+X%2E%22">Fontané, X.</searchLink><br /><searchLink fieldCode="AU" term="%22Calvo-Barrio%2C+L%2E%22">Calvo-Barrio, L.</searchLink><br /><searchLink fieldCode="AU" term="%22Izquierdo-Roca%2C+V%2E%22">Izquierdo-Roca, V.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; May 2 2011, Vol. 98 Issue 18, p181905-1-181905-3, 3p
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      – Type: doi
        Value: 10.1063/1.3587614
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      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 181905-1
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      – TitleFull: In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu2ZnSnS4 layers for solar cell applications.
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            NameFull: Fontané, X.
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            NameFull: Calvo-Barrio, L.
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            NameFull: Izquierdo-Roca, V.
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            – D: 02
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              Text: May 2 2011
              Type: published
              Y: 2011
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