Measurement of diffusion profile on Zn in n-type GaAs by a spreading resistance technique.

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Bibliographic Details
Title: Measurement of diffusion profile on Zn in n-type GaAs by a spreading resistance technique.
Authors: Frank, H., Azim, S. A.
Source: Solid-State Electronics; July 1967, Vol. 10, p727-728, 2p
Database: Applied Science & Technology Source
Description
ISSN:00381101