Measurement of diffusion profile on Zn in n-type GaAs by a spreading resistance technique.

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Bibliographic Details
Title: Measurement of diffusion profile on Zn in n-type GaAs by a spreading resistance technique.
Authors: Frank, H., Azim, S. A.
Source: Solid-State Electronics; July 1967, Vol. 10, p727-728, 2p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 516529974
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Measurement of diffusion profile on Zn in n-type GaAs by a spreading resistance technique.
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  Data: <searchLink fieldCode="JN" term="%22Solid-State+Electronics%22">Solid-State Electronics</searchLink>; July 1967, Vol. 10, p727-728, 2p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=516529974
RecordInfo BibRecord:
  BibEntity:
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 2
        StartPage: 727
    Titles:
      – TitleFull: Measurement of diffusion profile on Zn in n-type GaAs by a spreading resistance technique.
        Type: main
  BibRelationships:
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      – PersonEntity:
          Name:
            NameFull: Frank, H.
      – PersonEntity:
          Name:
            NameFull: Azim, S. A.
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      – BibEntity:
          Dates:
            – D: 01
              M: 07
              Text: July 1967
              Type: published
              Y: 1967
          Identifiers:
            – Type: issn-print
              Value: 00381101
          Numbering:
            – Type: volume
              Value: 10
          Titles:
            – TitleFull: Solid-State Electronics
              Type: main
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