Interpretation of non-equilibrium measurements on MOS devices using the linear voltage ramp technique.
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| Title: | Interpretation of non-equilibrium measurements on MOS devices using the linear voltage ramp technique. |
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| Authors: | Faraone, L. |
| Source: | Solid-State Electronics; August 1981, Vol. 24, p709-716, 8p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00381101 |
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