APA (7th ed.) Citation

Faraone, L. (1981). Interpretation of non-equilibrium measurements on MOS devices using the linear voltage ramp technique. Solid-State Electronics, 24, 709.

Chicago Style (17th ed.) Citation

Faraone, L. "Interpretation of Non-equilibrium Measurements on MOS Devices Using the Linear Voltage Ramp Technique." Solid-State Electronics 24 (1981): 709.

MLA (9th ed.) Citation

Faraone, L. "Interpretation of Non-equilibrium Measurements on MOS Devices Using the Linear Voltage Ramp Technique." Solid-State Electronics, vol. 24, 1981, p. 709.