Speciation of trace levels by helium microwave-induced plasma emission spectrometry.

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Bibliographic Details
Title: Speciation of trace levels by helium microwave-induced plasma emission spectrometry.
Authors: Bauer, C. F., Natusch, D. F. S.
Source: Analytical Chemistry; November 1981, Vol. 53, p2020-2027, 8p
Database: Applied Science & Technology Source
Description
ISSN:00032700