In situ Control of Si/Ge Growth on Stripe-Patterned Substrates Using Reflection High-Energy Electron Diffraction and Scanning Tunneling Microscopy.
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| Title: | In situ Control of Si/Ge Growth on Stripe-Patterned Substrates Using Reflection High-Energy Electron Diffraction and Scanning Tunneling Microscopy. |
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| Authors: | Sanduijav, B.1, Matei, D., Springholz, G.1, gunther.springholz@jku.at |
| Source: | Nanoscale Research Letters; Dec2010, Vol. 5 Issue 12, p1935-1941, 7p, 4 Diagrams, 2 Graphs |
| Database: | Applied Science & Technology Source |
| ISSN: | 19317573 |
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| DOI: | 10.1007/s11671-010-9814-8 |
