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In situ Control of Si/Ge Growth on Stripe-Patterned Substrates Using Reflection High-Energy Electron Diffraction and Scanning Tunneling Microscopy.

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Title: In situ Control of Si/Ge Growth on Stripe-Patterned Substrates Using Reflection High-Energy Electron Diffraction and Scanning Tunneling Microscopy.
Authors: Sanduijav, B.1, Matei, D., Springholz, G.1, gunther.springholz@jku.at
Source: Nanoscale Research Letters; Dec2010, Vol. 5 Issue 12, p1935-1941, 7p, 4 Diagrams, 2 Graphs
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 55387405
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PubType: Academic Journal
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  Data: In situ Control of Si/Ge Growth on Stripe-Patterned Substrates Using Reflection High-Energy Electron Diffraction and Scanning Tunneling Microscopy.
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  Data: <searchLink fieldCode="AU" term="%22Sanduijav%2C+B%2E%22">Sanduijav, B.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Matei%2C+D%2E%22">Matei, D.</searchLink><br /><searchLink fieldCode="AU" term="%22Springholz%2C+G%2E%22">Springholz, G.</searchLink><relatesTo>1</relatesTo>, <i>gunther.springholz@jku.at</i>
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  Data: <searchLink fieldCode="JN" term="%22Nanoscale+Research+Letters%22">Nanoscale Research Letters</searchLink>; Dec2010, Vol. 5 Issue 12, p1935-1941, 7p, 4 Diagrams, 2 Graphs
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=55387405
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      – Type: doi
        Value: 10.1007/s11671-010-9814-8
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 1935
    Titles:
      – TitleFull: In situ Control of Si/Ge Growth on Stripe-Patterned Substrates Using Reflection High-Energy Electron Diffraction and Scanning Tunneling Microscopy.
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            NameFull: Sanduijav, B.
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            NameFull: Matei, D.
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            – D: 01
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              Text: Dec2010
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              Y: 2010
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              Value: 12
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