Efficient Trimmed-sample Monte Carlo Methodology and Yield-aware Design Flow for Analog Circuits.
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| Title: | Efficient Trimmed-sample Monte Carlo Methodology and Yield-aware Design Flow for Analog Circuits. |
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| Authors: | Chin-Cheng Kuo1, cckuoz@tsmc.com, Wei-Yi Hu1,2, wyhu@tsmc.com, Yi-Hung Chen1, simonchen@tsmc.com, Jui-Feng Kuan1, jfkuan@tsmc.com, Yi-Kan Cheng1, ykcheng@tsmc.com |
| Source: | DAC: Annual ACM/IEEE Design Automation Conference; Jun2012, p1113-1118, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 0738100X |
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