Reliability behavior of lead-free solder joints in electronic components.
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| Title: | Reliability behavior of lead-free solder joints in electronic components. |
|---|---|
| Authors: | Zhang, Liang, zhangliang@nuaa.edu.cn, Han, Ji-guang1, He, Cheng-wen1, Guo, Yong-huan1 |
| Source: | Journal of Materials Science: Materials in Electronics; Jan2013, Vol. 24 Issue 1, p172-190, 19p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 84582165 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=84582165 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s10854-012-0720-y Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 19 StartPage: 172 Titles: – TitleFull: Reliability behavior of lead-free solder joints in electronic components. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Zhang, Liang – PersonEntity: Name: NameFull: Han, Ji-guang – PersonEntity: Name: NameFull: He, Cheng-wen – PersonEntity: Name: NameFull: Guo, Yong-huan IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: Jan2013 Type: published Y: 2013 Identifiers: – Type: issn-print Value: 09574522 Numbering: – Type: volume Value: 24 – Type: issue Value: 1 Titles: – TitleFull: Journal of Materials Science: Materials in Electronics Type: main |
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