The extended wedge method: Atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes.
Saved in:
| Title: | The extended wedge method: Atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes. |
|---|---|
| Authors: | Khare, H. S.1, Burris, D. L.1 |
| Source: | Review of Scientific Instruments; May2013, Vol. 84 Issue 5, p055108, 9p, 2 Diagrams, 2 Charts, 4 Graphs |
| Database: | Applied Science & Technology Source |
| ISSN: | 00346748 |
|---|---|
| DOI: | 10.1063/1.4804163 |
