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The extended wedge method: Atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes.

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Title: The extended wedge method: Atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes.
Authors: Khare, H. S.1, Burris, D. L.1
Source: Review of Scientific Instruments; May2013, Vol. 84 Issue 5, p055108, 9p, 2 Diagrams, 2 Charts, 4 Graphs
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 87924975
AccessLevel: 2
PubType: Academic Journal
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        Value: 10.1063/1.4804163
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      – Code: eng
        Text: English
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        PageCount: 9
        StartPage: 055108
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              Text: May2013
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              Y: 2013
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