Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film.

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Bibliographic Details
Title: Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film.
Authors: Bartosik, M.1,2, matthias.bartosik@tuwien.ac.at, Daniel, R.3, Mitterer, C.3, Matko, I.4, Burghammer, M.5, Mayrhofer, P.H.2,6, Keckes, J.1,7
Source: Thin Solid Films; Sep2013, Vol. 542, p1-4, 4p
Database: Applied Science & Technology Source
Description
ISSN:00406090
DOI:10.1016/j.tsf.2013.05.102