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Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film.

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Title: Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film.
Authors: Bartosik, M.1,2, matthias.bartosik@tuwien.ac.at, Daniel, R.3, Mitterer, C.3, Matko, I.4, Burghammer, M.5, Mayrhofer, P.H.2,6, Keckes, J.1,7
Source: Thin Solid Films; Sep2013, Vol. 542, p1-4, 4p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 89609124
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film.
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=89609124
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      – Type: doi
        Value: 10.1016/j.tsf.2013.05.102
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      – Code: eng
        Text: English
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        PageCount: 4
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      – TitleFull: Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film.
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            NameFull: Bartosik, M.
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            – D: 02
              M: 09
              Text: Sep2013
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              Y: 2013
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