Bibliographic Details
| Title: |
Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-Property Relationships in Thin-Film Solar Cells. |
| Authors: |
Abou-Ras, D.1, daniel.abou-ras@helmholtz-berlin.de, Kavalakkatt, J.1, Nichterwitz, M.1, Schäfer, N.1, Harndt, S.1, Wilkinson, A.2, Tsyrulin, K.3, Schulz, H.3, Bauer, F.4 |
| Source: |
JOM: The Journal of The Minerals, Metals & Materials Society (TMS); Sep2013, Vol. 65 Issue 9, p1222-1228, 7p, 3 Color Photographs, 1 Black and White Photograph, 2 Diagrams, 2 Graphs |
| Database: |
Applied Science & Technology Source |
