APA (7th ed.) Citation

Abou-Ras, D., Kavalakkatt, J., Nichterwitz, M., Schäfer, N., Harndt, S., Wilkinson, A., . . . Bauer, F. (2013). Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-Property Relationships in Thin-Film Solar Cells. JOM: The Journal of The Minerals, Metals & Materials Society (TMS), 65(9), 1222. https://doi.org/10.1007/s11837-013-0685-1

Chicago Style (17th ed.) Citation

Abou-Ras, D., J. Kavalakkatt, M. Nichterwitz, N. Schäfer, S. Harndt, A. Wilkinson, K. Tsyrulin, H. Schulz, and F. Bauer. "Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-Property Relationships in Thin-Film Solar Cells." JOM: The Journal of The Minerals, Metals & Materials Society (TMS) 65, no. 9 (2013): 1222. https://doi.org/10.1007/s11837-013-0685-1.

MLA (9th ed.) Citation

Abou-Ras, D., et al. "Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-Property Relationships in Thin-Film Solar Cells." JOM: The Journal of The Minerals, Metals & Materials Society (TMS), vol. 65, no. 9, 2013, p. 1222, https://doi.org/10.1007/s11837-013-0685-1.