Laser bea m diffraction at the edge of a film and application to thin film metrology.

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Bibliographic Details
Title: Laser bea m diffraction at the edge of a film and application to thin film metrology.
Authors: Do, P. A.1, Touaibia, M.2, Haché, A.1, hachea@umoncton.ca
Source: Applied Optics (1559-128X); 8/20/2013, Vol. 52 Issue 24, p5979-5984, 6p
Database: Applied Science & Technology Source
Description
ISSN:1559128X
DOI:10.1364/AO.52.005979