High temperature reverse bias reliability testing of high power devices.
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| Title: | High temperature reverse bias reliability testing of high power devices. |
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| Authors: | WENG, LISHAN, Lishan.Weng@keithley.com |
| Source: | Solid State Technology; Sep2013, Vol. 56 Issue 6, p21-24, 4p |
| Database: | Applied Science & Technology Source |
| ISSN: | 0038111X |
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