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Security Analysis of Industrial Test Compression Schemes.

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Bibliographic Details
Title: Security Analysis of Industrial Test Compression Schemes.
Authors: Das, Amitabh1, Ege, Baris2, Ghosh, Santosh3, Batina, Lejla2, Verbauwhede, Ingrid1
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Dec2013, Vol. 32 Issue 12, p1966-1977, 12p
Database: Applied Science & Technology Source
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