Proximity gettering of slow diffuser contaminants in CMOS image sensors.
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| Title: | Proximity gettering of slow diffuser contaminants in CMOS image sensors. |
|---|---|
| Authors: | Russo, F.1, frusso@micron.com, Moccia, G.1, gmoccia@micron.com, Nardone, G.1, gnardone@micron.com, Alfonsetti, R.1, ralfonsetti@micron.com, Polsinelli, G.1, gpolsinelli@micron.com, D’Angelo, A.1, adangelo@micron.com, Patacchiola, A.1, apatacchiola@micron.com, Liverani, M.1, mliverani@micron.com, Pianezza, P.1, ppianezza@micron.com, Lippa, T.1, tlippa@micron.com, Carlini, M.1, mcarlini@micron.com, Polignano, M.L.2, maria.polignano@st.com, Mica, I.2, imica@micron.com, Cazzini, E.2, ecazzini@micron.com, Ceresoli, M.2, monica.ceresoli@unimi.it, Codegoni, D.2, davide.codegoni@st.com |
| Source: | Solid-State Electronics; Jan2014, Vol. 91, p91-99, 9p |
| Database: | Applied Science & Technology Source |
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