View in EDS

The Impact of X-Ray and Proton Irradiation on HfO_2/Hf-Based Bipolar Resistive Memories.

Saved in:
Bibliographic Details
Title: The Impact of X-Ray and Proton Irradiation on HfO_2/Hf-Based Bipolar Resistive Memories.
Authors: Bi, J. S.1, Han, Z. S.2, Zhang, E. X.1, McCurdy, M. W.1, Reed, R. A.1, Schrimpf, R. D.1, Fleetwood, D. M.1, Alles, M. L.1, Weller, R. A.1, Linten, D.3, Jurczak, M.3, Fantini, A.3
Source: IEEE Transactions on Nuclear Science; Dec2013 Part 1, Vol. 60 Issue 6, p4540-4546, 7p
Database: Applied Science & Technology Source
Description
ISSN:00189499
DOI:10.1109/TNS.2013.2289369