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Defect Tolerance in Nanodevice-Based Programmable Interconnects: Utilization Beyond Avoidance.

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Bibliographic Details
Title: Defect Tolerance in Nanodevice-Based Programmable Interconnects: Utilization Beyond Avoidance.
Authors: Jason Cong1,2,3, Cong@cs.ucla.edu, Bingjun Xiao1,2, xiao@cs.ucla.edu
Source: DAC: Annual ACM/IEEE Design Automation Conference; Jun2013, p1-8, 8p
Database: Applied Science & Technology Source
Description
ISSN:0738100X