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Defect Tolerance in Nanodevice-Based Programmable Interconnects: Utilization Beyond Avoidance.

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Bibliographic Details
Title: Defect Tolerance in Nanodevice-Based Programmable Interconnects: Utilization Beyond Avoidance.
Authors: Jason Cong1,2,3, Cong@cs.ucla.edu, Bingjun Xiao1,2, xiao@cs.ucla.edu
Source: DAC: Annual ACM/IEEE Design Automation Conference; Jun2013, p1-8, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 96042376
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Defect Tolerance in Nanodevice-Based Programmable Interconnects: Utilization Beyond Avoidance.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Jason+Cong%22">Jason Cong</searchLink><relatesTo>1,2,3</relatesTo>, <i>Cong@cs.ucla.edu</i><br /><searchLink fieldCode="AU" term="%22Bingjun+Xiao%22">Bingjun Xiao</searchLink><relatesTo>1,2</relatesTo>, <i>xiao@cs.ucla.edu</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22DAC%3A+Annual+ACM%2FIEEE+Design+Automation+Conference%22">DAC: Annual ACM/IEEE Design Automation Conference</searchLink>; Jun2013, p1-8, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=96042376
RecordInfo BibRecord:
  BibEntity:
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 8
        StartPage: 1
    Titles:
      – TitleFull: Defect Tolerance in Nanodevice-Based Programmable Interconnects: Utilization Beyond Avoidance.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Jason Cong
      – PersonEntity:
          Name:
            NameFull: Bingjun Xiao
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 06
              Text: Jun2013
              Type: published
              Y: 2013
          Identifiers:
            – Type: issn-print
              Value: 0738100X
          Titles:
            – TitleFull: DAC: Annual ACM/IEEE Design Automation Conference
              Type: main
ResultId 1