An Ultralow EOT Ge MOS Device With Tetragonal HfO2 and High Quality HfxGeyO Interfacial Layer.

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Bibliographic Details
Title: An Ultralow EOT Ge MOS Device With Tetragonal HfO2 and High Quality HfxGeyO Interfacial Layer.
Authors: Fu, Chung-Hao1, Chang-Liao, Kuei-Shu1, Liu, Li-Jung1, Li, Chen-Chien1, Chen, Ting-Ching1, Cheng, Jen-Wei1, Lu, Chun-Chang1
Source: IEEE Transactions on Electron Devices; Aug2014, Vol. 61 Issue 8, p2662-2667, 6p
Database: Applied Science & Technology Source
Description
ISSN:00189383
DOI:10.1109/TED.2014.2329839