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Surface photovoltage measurement of light instability of amorphous silicon films.

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Bibliographic Details
Title: Surface photovoltage measurement of light instability of amorphous silicon films.
Authors: Epstein, K. A., Tran, N. T., Jeffrey, F. R., Moore, A. R.
Source: Applied Physics Letters; 7/21/1986, Vol. 49 Issue 3, p173, 3p
Database: Applied Science & Technology Source
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