Brady, F. T., Li, S. S., Burk, D. E., & Krull, W. A. (1988). Determination of the fixed oxide charge and interface trap densities for buried oxide layers formed by oxygen implantation. Applied Physics Letters, 52(11), 886. https://doi.org/10.1063/1.99262
Chicago Style (17th ed.) CitationBrady, F. T., S. S. Li, D. E. Burk, and W. A. Krull. "Determination of the Fixed Oxide Charge and Interface Trap Densities for Buried Oxide Layers Formed by Oxygen Implantation." Applied Physics Letters 52, no. 11 (1988): 886. https://doi.org/10.1063/1.99262.
MLA (9th ed.) CitationBrady, F. T., et al. "Determination of the Fixed Oxide Charge and Interface Trap Densities for Buried Oxide Layers Formed by Oxygen Implantation." Applied Physics Letters, vol. 52, no. 11, 1988, p. 886, https://doi.org/10.1063/1.99262.