Silicon epitaxial growth on (100) patterned oxide wafers at 800 °C by ultralow-pressure chemical vapor deposition.

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Bibliographic Details
Title: Silicon epitaxial growth on (100) patterned oxide wafers at 800 °C by ultralow-pressure chemical vapor deposition.
Authors: Yew, Tri-Rung, O, Kenneth, Reif, Rafael
Source: Applied Physics Letters; 5/23/1988, Vol. 52 Issue 21, p1797, 3p
Database: Applied Science & Technology Source
Description
ISSN:00036951
DOI:10.1063/1.99629