Erratum: Silicon epitaxial growth on (100) patterned oxide wafers at 800 °C by ultralow-pressure chemical vapor deposition [Appl. Phys. Lett. 52, 1797 (1988)].

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Title: Erratum: Silicon epitaxial growth on (100) patterned oxide wafers at 800 °C by ultralow-pressure chemical vapor deposition [Appl. Phys. Lett. 52, 1797 (1988)].
Authors: Yew, Tri-Rung, O, Kenneth, Reif, Rafael
Source: Applied Physics Letters; 6/13/1988, Vol. 52 Issue 24, p2061, 3p
Database: Applied Science & Technology Source
Description
ISSN:00036951
DOI:10.1063/1.99663