Growth and characterization of Ge/Si strained-layer superlattices.
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| Title: | Growth and characterization of Ge/Si strained-layer superlattices. |
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| Authors: | Chang, S. J., Huang, C. F., Kallel, M. A., Wang, K. L., Bowman, R. C., Adams, P. M. |
| Source: | Applied Physics Letters; 11/7/1988, Vol. 53 Issue 19, p1835, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
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| DOI: | 10.1063/1.100369 |
