Chang, S. J., Huang, C. F., Kallel, M. A., Wang, K. L., Bowman, R. C., & Adams, P. M. (1988). Growth and characterization of Ge/Si strained-layer superlattices. Applied Physics Letters, 53(19), 1835. https://doi.org/10.1063/1.100369
Chicago Style (17th ed.) CitationChang, S. J., C. F. Huang, M. A. Kallel, K. L. Wang, R. C. Bowman, and P. M. Adams. "Growth and Characterization of Ge/Si Strained-layer Superlattices." Applied Physics Letters 53, no. 19 (1988): 1835. https://doi.org/10.1063/1.100369.
MLA (9th ed.) CitationChang, S. J., et al. "Growth and Characterization of Ge/Si Strained-layer Superlattices." Applied Physics Letters, vol. 53, no. 19, 1988, p. 1835, https://doi.org/10.1063/1.100369.
Warning: These citations may not always be 100% accurate.