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Growth and characterization of Ge/Si strained-layer superlattices.

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Bibliographic Details
Title: Growth and characterization of Ge/Si strained-layer superlattices.
Authors: Chang, S. J., Huang, C. F., Kallel, M. A., Wang, K. L., Bowman, R. C., Adams, P. M.
Source: Applied Physics Letters; 11/7/1988, Vol. 53 Issue 19, p1835, 3p
Database: Applied Science & Technology Source
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