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Ambipolar diffusion length measurements in hydrogenated amorphous silicon.

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Bibliographic Details
Title: Ambipolar diffusion length measurements in hydrogenated amorphous silicon.
Authors: Balberg, I., Epstein, K. A., Ritter, D.
Source: Applied Physics Letters; 6/12/1989, Vol. 54 Issue 24, p2461, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 9831570
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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      – Type: doi
        Value: 10.1063/1.101072
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      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 2461
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      – TitleFull: Ambipolar diffusion length measurements in hydrogenated amorphous silicon.
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            NameFull: Balberg, I.
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            NameFull: Epstein, K. A.
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              Text: 6/12/1989
              Type: published
              Y: 1989
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