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Scanning Electron Microscopy: Extrapolation of 3D Data from SEM Micrographs.

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Bibliographic Details
Title: Scanning Electron Microscopy: Extrapolation of 3D Data from SEM Micrographs.
Authors: KAREIVA, Simonas1, SELSKIS, Algirdas2, IVANAUSKAS, Feliksas3, ŠAKIRZANOVAS, Simas1,2, KAREIVA, Aivaras1 aivaras.kareiva@chf.vu.lt
Source: Materials Science / Medziagotyra. 2015, Vol. 21 Issue 4, p640-646. 7p.
Database: Academic Search Ultimate
Description
ISSN:13921320
DOI:10.5755/j01.ms.21.4.11101