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Análisis de robustez ante variaciones de proceso en amplificadores CMOS integrados de bajo ruido.

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Title: Análisis de robustez ante variaciones de proceso en amplificadores CMOS integrados de bajo ruido.
Authors: González Ríos, Jorge L.1 jorgeluis.gr@electrica.cujae.edu.cu, Cruz Hurtado, Juan C.2 juankacruzhurtado@gmail.com, Moreno, Robson L.3 moreno@unifei.edu.br, Vázquez, Diego4 dgarcia@imse-cnm.csic.es
Source: Ingeniería Electrónica: Automatica y Comunicaciones. ene-abr2016, Vol. 37 Issue 1, p1-8. 8p.
Database: Academic Search Ultimate
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        Text: Spanish
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