View in EDS

Self-compliance multilevel storage characteristic in HfO2-based device.

Saved in:

Bibliographic Details
Title:	Self-compliance multilevel storage characteristic in HfO2-based device.
Authors:	Xiao-Ping Gao¹, Li-Ping Fu², Chuan-Bing Chen³, Peng Yuan³, Ying-Tao Li^3,4 li_yt06@lzu.edu.cn
Source:	Chinese Physics B. Oct2016, Vol. 25 Issue 10, p1-1. 1p.
Database:	Academic Search Ultimate

Description
ISSN:	16741056
DOI:	10.1088/1674-1056/25/10/106102