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Self-compliance multilevel storage characteristic in HfO2-based device.

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Bibliographic Details
Title: Self-compliance multilevel storage characteristic in HfO2-based device.
Authors: Xiao-Ping Gao1, Li-Ping Fu2, Chuan-Bing Chen3, Peng Yuan3, Ying-Tao Li3,4 li_yt06@lzu.edu.cn
Source: Chinese Physics B. Oct2016, Vol. 25 Issue 10, p1-1. 1p.
Database: Academic Search Ultimate
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