Inspection of periodically poled waveguide devices by confocal luminescence microscopy.
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| Title: | Inspection of periodically poled waveguide devices by confocal luminescence microscopy. |
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| Authors: | Dierolf, V.1 vod2@lehigh.edu, Sandmann, C.1 |
| Source: | Applied Physics B: Lasers & Optics. Feb2004, Vol. 78 Issue 3/4, p363-366. 4p. |
| Database: | Academic Search Ultimate |
| ISSN: | 09462171 |
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| DOI: | 10.1007/s00340-003-1377-2 |
