APA (7th ed.) Citation

Dierolf, V., & Sandmann, C. (2004). Inspection of periodically poled waveguide devices by confocal luminescence microscopy. Applied Physics B: Lasers & Optics, 78(3/4), 363. https://doi.org/10.1007/s00340-003-1377-2

Chicago Style (17th ed.) Citation

Dierolf, V., and C. Sandmann. "Inspection of Periodically Poled Waveguide Devices by Confocal Luminescence Microscopy." Applied Physics B: Lasers & Optics 78, no. 3/4 (2004): 363. https://doi.org/10.1007/s00340-003-1377-2.

MLA (9th ed.) Citation

Dierolf, V., and C. Sandmann. "Inspection of Periodically Poled Waveguide Devices by Confocal Luminescence Microscopy." Applied Physics B: Lasers & Optics, vol. 78, no. 3/4, 2004, p. 363, https://doi.org/10.1007/s00340-003-1377-2.