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Inspection of periodically poled waveguide devices by confocal luminescence microscopy.

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Title: Inspection of periodically poled waveguide devices by confocal luminescence microscopy.
Authors: Dierolf, V.1 vod2@lehigh.edu, Sandmann, C.1
Source: Applied Physics B: Lasers & Optics. Feb2004, Vol. 78 Issue 3/4, p363-366. 4p.
Database: Academic Search Ultimate
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        Value: 10.1007/s00340-003-1377-2
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              Text: Feb2004
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