View in EDS HTML Full Text PDF Full Text

Measurement of wavelength-dependent radiation pressure from photon reflection and absorption due to thin film interference.

Saved in:
Bibliographic Details
Title: Measurement of wavelength-dependent radiation pressure from photon reflection and absorption due to thin film interference.
Authors: Ma, Dakang1,2, Munday, Jeremy N.1,2 jnmunday@umd.edu
Source: Scientific Reports. 10/29/2018, Vol. 8 Issue 1, p1-1. 1p.
Database: Academic Search Ultimate
Full text is not displayed to guests.
Description
ISSN:20452322
DOI:10.1038/s41598-018-34381-z