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Feasibility and utility of intraoperative epicardial scar characterization during left ventricular assist device implantation.

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Title: Feasibility and utility of intraoperative epicardial scar characterization during left ventricular assist device implantation.
Authors: Moss, Joshua D.1 Joshua.Moss@ucsf.edu, Oesterle, Adam1, Raiman, Michael2, Flatley, Erin E.1, Beaser, Andrew D.3, Jeevanandam, Valluvan4, Klein, Liviu5, Ota, Takeyoshi4, Wieselthaler, Georg6, Uriel, Nir7, Tung, Roderick3
Source: Journal of Cardiovascular Electrophysiology. Feb2019, Vol. 30 Issue 2, p183-192. 10p. 1 Color Photograph, 2 Diagrams, 3 Charts.
Database: Academic Search Ultimate
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ISSN:10453873
DOI:10.1111/jce.13803