APA (7th ed.) Citation

Moss, J. D., Oesterle, A., Raiman, M., Flatley, E. E., Beaser, A. D., Jeevanandam, V., . . . Tung, R. (2019). Feasibility and utility of intraoperative epicardial scar characterization during left ventricular assist device implantation. Journal of Cardiovascular Electrophysiology, 30(2), 183. https://doi.org/10.1111/jce.13803

Chicago Style (17th ed.) Citation

Moss, Joshua D., et al. "Feasibility and Utility of Intraoperative Epicardial Scar Characterization During Left Ventricular Assist Device Implantation." Journal of Cardiovascular Electrophysiology 30, no. 2 (2019): 183. https://doi.org/10.1111/jce.13803.

MLA (9th ed.) Citation

Moss, Joshua D., et al. "Feasibility and Utility of Intraoperative Epicardial Scar Characterization During Left Ventricular Assist Device Implantation." Journal of Cardiovascular Electrophysiology, vol. 30, no. 2, 2019, p. 183, https://doi.org/10.1111/jce.13803.