A Novel Resistive Switching Identification Method through Relaxation Characteristics for Sneak-path-constrained Selectorless RRAM application.

Saved in:
Bibliographic Details
Title: A Novel Resistive Switching Identification Method through Relaxation Characteristics for Sneak-path-constrained Selectorless RRAM application.
Authors: Chen, Ying-Chen1 yingchenchen@utexas.edu, Lin, Chao-Cheng2, Hu, Szu-Tung3, Lin, Chih-Yang4, Fowler, Burt1, Lee, Jack1
Source: Scientific Reports. 8/27/2019, Vol. 9 Issue 1, pN.PAG-N.PAG. 1p.
Database: Academic Search Ultimate
Full text is not displayed to guests.
Description
ISSN:20452322
DOI:10.1038/s41598-019-48932-5