Temperature-dependent infrared ellipsometry of Mo-doped VO2 thin films across the insulator to metal transition.
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| Title: | Temperature-dependent infrared ellipsometry of Mo-doped VO2 thin films across the insulator to metal transition. |
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| Authors: | Amador-Alvarado, S.1, Flores-Camacho, J. M.1, Solís-Zamudio, A.1, Castro-García, R.2, Pérez-Huerta, J. S.3, Antúnez-Cerón, E.4,5, Ortega-Gallegos, J.1, Madrigal-Melchor, J.3, Agarwal, V.6, Ariza-Flores, D.2 david.ariza@cactus.iico.uaslp.mx |
| Source: | Scientific Reports. 5/22/2020, Vol. 10 Issue 1, p1-11. 11p. |
| Database: | Academic Search Ultimate |
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| ISSN: | 20452322 |
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| DOI: | 10.1038/s41598-020-65279-4 |
